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scanning force microscopy (SFM)
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(Definition)
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This entry needs to be rendered, but on-demand rendering is temporarily disabled while Physics Library is under heavy load. Please try again later. "scanning force microscopy (SFM)" is owned by bci1.(view preamble)
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| Other names: |
AFM, atomic force microscopy |
| Also defines: |
SFM, AFM, scanning microscopy with a cantilever, micron resolution, nanometer resolution microscopy, mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic force microscope (MFM), Casimir forces, solvation forces, Wheatstone bridge |
| Keywords: |
AFM, atomic force microscopy, Wheatstone bridge, scanning microscopy, cantilever, micron resolution, nanometer resolution microscopy, mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic force microscope (MFM), Casimir forces, solvation forces |
There are 2 references to this object.
This is version 4 of scanning force microscopy (SFM), born on 2010-11-27, modified 2010-11-27.
Object id is 893, canonical name is ScanningForceMicroscopySFM.
Accessed 7984 times total.
Classification:
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